57 results
Latency Dose Formation In DMC By Inelastic Electron Scattering
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2216-2217
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- August 2022
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Coherence and Inelastic Scattering in Electron Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2762-2763
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- August 2022
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From South Asia to World History through C. A. Bayly's Work
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- The Journal of Asian Studies / Volume 78 / Issue 4 / November 2019
- Published online by Cambridge University Press:
- 16 September 2019, pp. 869-881
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- November 2019
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STEM Imaging and Phase Mapping of Precipitation in Alloy 718 Using an Electron Microscope Pixel Array Detector
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2246-2247
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- July 2017
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P.046 Multiple intracranial mycotic aneurysms and management dilemma in postinterventional cerebral vasospasm: a case report
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- Canadian Journal of Neurological Sciences / Volume 44 / Issue S2 / June 2017
- Published online by Cambridge University Press:
- 02 June 2017, p. S25
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Towards Quantitative 3D Chemical Analysis in TEM Using Quadrant XEDS Detector Geometry
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 762-763
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- August 2014
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OCHOTONOPHILA FLAVA (CARYOPHYLLACEAE), A NEW SPECIES FROM CENTRAL AFGHANISTAN
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- Edinburgh Journal of Botany / Volume 70 / Issue 3 / November 2013
- Published online by Cambridge University Press:
- 18 October 2013, pp. 405-412
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- November 2013
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The Contribution of Thermally Scattered Electrons to Atomic Resolution Elemental Maps
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1172-1173
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- August 2013
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Analytical Transmission Electron Microscopy in the Third Dimension
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1276-1277
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- July 2012
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Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 598-599
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- July 2011
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Comparison of the Detection Limits of EDS and EELS in S/TEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1312-1313
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- July 2010
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Quantitative Atomic 3-D Imaging of Single/Double Sheet Graphene Structure by Exit-Wave Reconstruction Using a Titan G2 at 80kV Acceleration Voltage
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1468-1469
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- July 2010
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Applications of spherical aberration correction in STEM and TEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 68-69
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- July 2010
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Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology
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- Microscopy Today / Volume 18 / Issue 4 / July 2010
- Published online by Cambridge University Press:
- 07 July 2010, pp. 14-20
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- July 2010
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Sub-nanometer Resolution in Field-free Imaging using a Titan 80-300 with Lorentz lens and Image Cs-Corrector at 300kV Acceleration Voltage
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 184-185
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- July 2009
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Quantum Wells in the Ternary System Zn(1-X)CdXSe by High Rresolution Microscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1222-1223
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- July 2009
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An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 208-209
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- July 2009
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Characterization of the holography performance of a Titan 80-300 with high brightness Schottky electron gun and image Cs-corrector at 300kV acceleration voltage
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1098-1099
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- July 2009
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Sacred Symbol as Mobilizing Ideology: The North Indian Search for a“Hindu” community
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- Comparative Studies in Society and History / Volume 22 / Issue 4 / October 1980
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- 03 June 2009, pp. 597-625
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Quantitative Characterization of the Interface Between a V2O3 Layer and Cu3Au (001) by Cs Corrected HREM
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- MRS Online Proceedings Library Archive / Volume 1184 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1184-HH08-10
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- 2009
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